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[WM]: Conf. Wavelet Applications in Industrial Processing V: general deadline prolongation for Optics East 07
>>> General deadline prolongation for Optics East 07 <<<
Abstract Due Date : 18 May
Wavelet Applications in Industrial Processing V (SA109) Part of SPIE’s International Symposium on Optics East 2007
9-12 September 2007 • Seaport World Trade Center • Boston, MA, USA
--- Abstract Due Date : 18 May 2007 ---
--- Manuscript Due Date: 13 August 2007 ---
Web site
http://www.spie.org/app/program/index.cfm?
fuseaction=conferencedetail&export_id=x12510&ID=x6084&redir=x6084.xml&co
nference_id=767974&event_id=765022&programtrack_id=769810
ABSTRACT TEXT Approximately 500 words.
Conference Chairs: Frédéric Truchetet, Univ. de Bourgogne (France);
Olivier Laligant, Univ. de Bourgogne (France)
Program Committee: Patrice Abry, École Normale Supérieure de Lyon
(France); Radu V. Balan, Siemens Corporate Research; Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel
Benazza-Benyahia,
Ecole Supérieure des Communications de Tunis (Tunisia); Albert Bijaoui, Observatoire de la Côte d'Azur (France); Seiji Hata,
Kagawa
Univ. (Japan); Henk J. A. M. Heijmans, Ctr. for Mathematics and Computer Science (Netherlands); William S. Hortos, Associates in
Communication Engineering Research and Technology; Jacques Lewalle, Syracuse Univ.; Wilfried R. Philips, Univ. Gent
(Belgium); Alexandra Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of Nottingham (United Kingdom); Hamed
Sari-Sarraf, Texas Tech Univ.; Peter Schelkens, Vrije Univ. Brussel (Belgium); Paul Scheunders, Univ. Antwerpen (Belgium);
Kenneth W. Tobin, Jr., Oak Ridge National Lab.; Günther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald Zauner,
Fachhochschule Wels (Austria)
The wavelet transform, multiresolution analysis, and other space- frequency or space-scale approaches are now considered standard
tools
by researchers in image and signal processing. Promising practical results in machine vision and sensors for industrial
applications and
non destructive testing have been obtained, and a lot of ideas can be
applied to industrial imaging projects.
This conference is intended to bring together practitioners, researchers, and technologists in machine vision, sensors, non
destructive testing, signal and image processing to share recent developments in wavelet and multiresolution approaches. Papers
emphasizing fundamental methods that are widely applicable to industrial inspection and other industrial applications are
especially welcome.
Papers are solicited but not limited to the following areas:
o New trends in wavelet and multiresolution approach, frame and overcomplete representations, Gabor transform, space-scale and
space- frequency analysis, multiwavelets, directional wavelets, lifting scheme for:
- sensors
- signal and image denoising, enhancement, segmentation, image deblurring
- texture analysis
- pattern recognition
- shape recognition
- 3D surface analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic data analysis
- real-time implementation
- image compression
- hardware, wavelet chips.
o Applications:
- machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- metrology
- real-time inspection.
o Applications in microelectronics manufacturing, web and paper products, glass, plastic, steel, inspection, power production,
chemical process, food and agriculture, pharmaceuticals, petroleum industry.
All submissions will be peer reviewed. Please note that abstracts must be at least 500 words in length in order to receive full
consideration.
..wsc
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