WMW
  NEWS     ABOUT     PARTNERS     CONTACT  
  HELP
WATERMARKING
  • Biography
  • FAQ
MAILINGLIST
  • Management
  • Archive
CONFERENCES
  • Calls
BENCHMARKING
  • Stirmark
  • CheckMark
  • Optimark
BOOKS
LINKS
  • Companies
  • Research
  • Others
WEBRING
DISCLAIMER

[Date Prev][Date Next][Thread Prev][Thread Next][Date Index][Thread Index]

[WM]: Call for papers : Wavelet Applications in Industrial Processing V




*** Call for = Papers and Announcement ***

Wavelet Applications in = Industrial Processing V (SA109)
Part of SPIE’s International = Symposium on Optics East 2007
9-12 September 2007 • Seaport = World Trade Center • Boston, MA, USA


--- Abstract Due = Date Deadline prolongation: 4 March 2007 ---
--- Manuscript = Due Date: 13 August 2007 ---

Web site
ABSTRACT TEXT  = Approximately 500 words.

Conference Chairs: Frédér= ic Truchetet, Univ. de Bourgogne (France); Olivier Laligant, Univ. de = Bourgogne (France)

Program Committee: Patrice Abry, École Normale Supérieure de Lyon (France); Radu V. Balan, = Siemens Corporate Research; Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia, Ecole Supérieure des Communications = de Tunis (Tunisia); Albert Bijaoui, Observatoire de la Côte d'Azur = (France); Seiji Hata, Kagawa Univ. (Japan); Henk J. A. M. Heijmans, Ctr. = for Mathematics and Computer Science (Netherlands); William S. Hortos, = Associates in Communication Engineering Research and Technology; Jacques = Lewalle, Syracuse Univ.; Wilfried R. Philips, Univ. Gent (Belgium); = Alexandra Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of = Nottingham (United Kingdom); Hamed Sari-Sarraf, Texas Tech Univ.; Peter = Schelkens, Vrije Univ. Brussel (Belgium); Paul Scheunders, Univ. Antwerpen (Belgium); Kenneth W. Tobin, Jr., Oak Ridge National Lab.; = Günther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald = Zauner, Fachhochschule Wels (Austria)

The wavelet transform, multiresolution analysis, and other space-frequency or space-scale = approaches are now considered standard tools by researchers in image and = signal processing. Promising practical results in machine vision and = sensors for industrial applications and non destructive testing have = been obtained, and a lot of ideas can be applied to industrial imaging = projects.
This conference is intended to bring together = practitioners, researchers, and technologists in machine vision, = sensors, non destructive testing, signal and image processing to share = recent developments in wavelet and multiresolution approaches. Papers emphasizing fundamental methods that are widely applicable to industrial = inspection and other industrial applications are especially = welcome.



Papers are solicited but = not limited to the following areas:

o New trends in wavelet and multiresolution approach, frame and overcomplete representations, Gabor = transform, space-scale and space-frequency analysis, multiwavelets, = directional wavelets, lifting scheme for:
- sensors
- signal and image denoising, enhancement, = segmentation, image deblurring
- texture analysis
- = pattern recognition
- shape recognition
- 3D surface = analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic = data analysis
- real-time implementation 
- image compression
- hardware, wavelet chips.

o Applications:
- = machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision 
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- metrology
- real-time inspection. 

o Applications in microelectronics manufacturing, web and paper products, glass, plastic, = steel, inspection, power production, chemical process, food and = agriculture, pharmaceuticals, petroleum industry.
All = submissions will be peer reviewed. Please note that abstracts must be at = least 500 words in length in order to receive full = consideration.

---------------------------------------------------------------------------------
! = Abstract Due Date Deadline prolongation: 4 March 2007   !
! Manuscript Due Date: 13 August 2007   !
---------------------------------------------------------------------------------



------------- Submission of = Abstracts for Optics East 2007 Symposium ------------
Abstract = Due Date Deadline prolongation: 4 March 2007 - Manuscript Due Date: 13 = August 2007
Abstracts, if accepted, will be distributed at the = meeting.

* IMPORTANT! 
- Submissions imply the intent of at least one = author to register, attend the symposium, present the paper (either = orally or in poster format), and submit a full-length manuscript for = publication in the conference Proceedings.
- By submitting = your abstract, you warrant that all clearances and permissions have been = obtained, and authorize SPIE to circulate your abstract to conference = committee members for review and selection purposes and if it is accepted, to publish your abstract in conference announcements and publicity.
- All authors (including invited or solicited = speakers), program committee members, and session chairs are responsible = for registering and paying the reduced author, session chair, program = committee registration fee. (Current SPIE Members receive a discount on = the registration fee.)



* Instructions for = Submitting Abstracts via Web

- You are STRONGLY = ENCOURAGED to submit abstracts using the “submit an abstract” link = at:
- Submitting directly on the Web ensures that your abstract will be immediately accessible by the conference chair for review through = MySPIE, SPIE’s author/chair web site. 
- Please note! When = submitting your abstract you must provide contact information for all = authors, summarize your paper, and identify the contact author who will = receive correspondence about the submission and who must submit the = manuscript and all revisions. Please have this information available = before you
begin the submission process.

- First-time users of = MySPIE can create a new account by clicking on the create new account = link. You can simplify account creation by using your SPIE ID# which is = found on SPIE membership cards or the label of any SPIE = mailing.

- If = you do not have web access, you may E-MAIL each abstract separately to: = abstracts@spie.org in ASCII = text (not encoded) format. There will be a time delay for abstracts = submitted via e-mail as they will not be immediately processed for chair review.
IMPORTANT! To ensure proper processing of your = abstract, the SUBJECT line must include only:
SUBJECT: SA109, = TRUCHETET, LALIGANT


- Your abstract submission = must include all of the following:
1. PAPER TITLE
2. = AUTHORS (principal author first) For each author: 
   o = First (given) Name (initials not acceptable)
   o Last (family) Name
   o Affiliation
   o Mailing = Address
   o Telephone Number
   o Fax = Number
   o Email Address
3. PRESENTATION = PREFERENCE "Oral Presentation" or "Poster Presentation." 
4. = PRINCIPAL AUTHOR’S BIOGRAPHY Approximately 50 words.
5. = ABSTRACT TEXT  Approximately 500 words.
   Accepted = abstracts for this conference will be included in the abstract CD-ROM = which will be available at the meeting. Please submit only 500-word = abstracts that are suitable for publication.
6. KEYWORDS Maximum of five keywords.

If you do not have web = access, you may E-MAIL each abstract separately to: abstracts@spie.org in ASCII text = (not encoded) format.  There will be a time delay for abstracts = submitted via e-mail as they will not be immediately processed for chair review. 


* Conditions of Acceptance
- Authors are expected to secure funding for = registration fees, travel, and accommodations, independent of SPIE, = through their sponsoring organizations before submitting = abstracts.

- = Only original material should be submitted.

- Commercial papers, papers = with no new research/development content, and papers where supporting = data or a technical description cannot be given for proprietary reasons = will not be accepted for presentation in this symposium.  

- Abstracts should contain = enough detail to clearly convey the approach and the results of the = research.

- = Government and company clearance to present and publish should be final = at the time of submittal. If you are a DoD contractor, allow at least 60 = days for clearance. Authors are required to warrant to SPIE in advance = of publication of the Proceedings that all necessary permissions and clearances have been obtained, and that submitting authors are = authorized to transfer copyright of the paper to SPIE.




* Review, Notification, = Program Placement

- To ensure a high-quality = conference, all abstracts and Proceedings manuscripts will be reviewed = by the Conference Chair/Editor for technical merit and suitability of = content. Conference Chair/Editors may require manuscript revision before = approving publication, and reserve the right to reject for presentation = or publication any paper that does not meet content or presentation = expectations. SPIE’s decision on whether to accept a presentation or = publish a manuscript is final.

- Applicants will be = notified of abstract acceptance and sent manuscript instructions by = e-mail no later than 7 May 2007. Notification of acceptance will be = placed on SPIE Web the week of 4 June 2007 at http://spie.org/events/oe

- Final placement in an oral or poster session is subject to the Chairs' discretion. = Instructions for oral and poster presentations will be sent to you by = e-mail. All oral and poster presentations require presentation at the = meeting and submission of a manuscript to be included in the Proceedings = of SPIE.




* Proceedings of = SPIE

- These = conferences will result in full-manuscript Chairs/Editor-reviewed = volumes published in the Proceedings of SPIE and in the SPIE Digital = Library.

- = Correctly formatted, ready-to-print manuscripts submitted in English are = required for all accepted oral and poster presentations. Electronic = submissions are recommended, and result in higher quality reproduction. = Submission must be provided in PostScript created with a printer driver compatible with SPIE’s online Electronic Manuscript Submission system. = Instructions are included in the author kit and from the “Author Info”= link at the conference website.

- Authors are required to = transfer copyright of the manuscript to SPIE or to provide a suitable = publication license.

- Papers published are = indexed in leading scientific databases including INSPEC, Ei Compendex, = Chemical Abstracts, International Aerospace Abstracts, Index to = Scientific and Technical Proceedings and NASA Astrophysical Data System, = and are searchable in the SPIE Digital Library. Full manuscripts are = available to Digital Library subscribers.

- Late manuscripts may not = be published in the conference Proceedings and SPIE Digital Library, = whether the conference volume will be published before or after the = meeting. The objective of this policy is to better serve the conference = participants as well as the technical community at large, by enabling = timely publication of the Proceedings. 

- Papers not presented at = the meeting will not be published in the
conference = Proceedings, except in the case of exceptional circumstances = at
the discretion of SPIE and the Conference = Chairs/Editors. 




wc


© 2000-2002 by WatermarkingWorld
Design and Concept by Martin Kutter